Title:
TEST APPARATUS AND METHOD FOR HIGH-SPEED LINK SYSTEM
Document Type and Number:
WIPO Patent Application WO/2020/108589
Kind Code:
A1
Abstract:
The present disclosure provides a test apparatus for a high-speed link system, comprising: a chip test device, a transmission insertion loss ISI attenuation device, a crosstalk ISI attenuation device and a crosstalk XTK test device. The XTK test device is configured to form, in a received attenuated transmission test signal, a crosstalk signal from a received attenuated crosstalk test signal, and transmit to the chip test device the attenuated transmission test signal carrying the crosstalk signal. The chip test device is further configured to perform test evaluation on quality parameters of the attenuated transmission test signal carrying the crosstalk signal. Further disclosed herein is a test method for a high-speed link system.
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Inventors:
LIU CHUNWEI (CN)
Application Number:
PCT/CN2019/121842
Publication Date:
June 04, 2020
Filing Date:
November 29, 2019
Export Citation:
Assignee:
ZTE CORP (CN)
International Classes:
H04B17/20
Foreign References:
| CN1921327A | 2007-02-28 | |||
| CN103026637A | 2013-04-03 | |||
| CN101543027A | 2009-09-23 | |||
| US20170012718A1 | 2017-01-12 |
Attorney, Agent or Firm:
BEYOND ATTORNEYS AT LAW (CN)
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