Title:
TEST METHOD, SCREENING METHOD, AND OLED DESIGN METHOD
Document Type and Number:
WIPO Patent Application WO/2020/199770
Kind Code:
A1
Abstract:
Provided is a test method for a doped layer. The doped layer comprises an organic material and a metal doped in the organic material. The method comprises: providing a test element, and detecting the light transmittance of the test element, the test element comprising a substrate, an organic material layer on the substrate, and a metal layer located on the organic material layer and in contact with the organic material layer. According to the test method, a doped layer can be tested in a low-cost and simple manner. Also provided are a screening method for an organic material of a doped layer and an organic light-emitting diode design method.
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Inventors:
YOU JUANJUAN (CN)
SHEN YONGQI (CN)
SHEN YONGQI (CN)
Application Number:
PCT/CN2020/075463
Publication Date:
October 08, 2020
Filing Date:
February 17, 2020
Export Citation:
Assignee:
BOE TECHNOLOGY GROUP CO LTD (CN)
International Classes:
H01L51/50; B07C5/342; H01L21/66
Foreign References:
| CN109950413A | 2019-06-28 | |||
| CN101971317A | 2011-02-09 | |||
| CN1971868A | 2007-05-30 | |||
| CN103811291A | 2014-05-21 | |||
| US20070146718A1 | 2007-06-28 |
Attorney, Agent or Firm:
LIU, SHEN & ASSOCIATES (CN)
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