Title:
TEST STRUCTURE AND TEST METHOD
Document Type and Number:
WIPO Patent Application WO/2021/036446
Kind Code:
A1
Abstract:
Provided in the present disclosure are a test structure and a test method. The test structure comprises: at least one spin orbit torque supply line; a plurality of resistive switching devices, each of which is located on the surface of the spin orbit torque supply line and comprises at least one magnetic layer; a first test electrode that is electrically connected to one end of the at least one spin orbit torque supply line; a second test electrode that is electrically connected to one end of the at least one spin orbit torque supply line; and a third test electrode that is electrically connected to one end of the resistive switching devices away from the spin orbit torque supply line. The test structure of the present disclosure is used for testing, so that it is possible to measure a plurality of devices at one time and obtain statistical information, which may in turn effectively reduce the testing time and greatly improve the testing efficiency.
Inventors:
HE SHIKUN (CN)
WANG MING (CN)
ZHU MIN (CN)
WANG MING (CN)
ZHU MIN (CN)
Application Number:
PCT/CN2020/097747
Publication Date:
March 04, 2021
Filing Date:
June 23, 2020
Export Citation:
Assignee:
ZHEJIANG HIKSTOR TECH CO LTD (CN)
International Classes:
G11C29/08
Foreign References:
| CN108109668A | 2018-06-01 | |||
| CN107689416A | 2018-02-13 | |||
| CN109065707A | 2018-12-21 | |||
| CN109256160A | 2019-01-22 | |||
| US20150214274A1 | 2015-07-30 | |||
| CN103165581A | 2013-06-19 |
Attorney, Agent or Firm:
KANGXIN PARTNERS, P.C. (CN)
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