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Title:
THERMOMETER SAMPLE AND HOLD DESIGN FOR NON-VOLATILE MEMORY
Document Type and Number:
WIPO Patent Application WO/2020/237456
Kind Code:
A1
Abstract:
A sample and hold scheme for temperature measurements for non-volatile memory can enable significant reduction in temperature readout latency. In one example thermometer circuits are enabled at a refresh rate to cause the temperature to be sensed and latched at regular intervals. By performing the temperature readings in the background at a refresh rate instead of on-demand, the temperature is available to service commands with almost no latency.

Inventors:
GUO XIAOJIANG (US)
SHI WEIHUA (CN)
Application Number:
PCT/CN2019/088530
Publication Date:
December 03, 2020
Filing Date:
May 27, 2019
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Assignee:
INTEL CORP (US)
GUO XIAOJIANG (US)
SHI WEIHUA (CN)
International Classes:
G11C7/04
Foreign References:
US10013194B12018-07-03
US10013194B12018-07-03
US4848923A1989-07-18
CN106528323A2017-03-22
Attorney, Agent or Firm:
SHANGHAI PATENT & TRADEMARK LAW OFFICE, LLC (CN)
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