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Title:
THREE-DIMENSIONAL SHAPE MEASUREMENT DEVICE, THREE-DIMENSIONAL SHAPE MEASUREMENT METHOD, STRUCTURE MANUFACTURING SYSTEM, STRUCTURE MANUFACTURING METHOD AND MEASUREMENT PROGRAM
Document Type and Number:
WIPO Patent Application WO/2016/113861
Kind Code:
A1
Abstract:
[Problem] To increase the success rate of three-dimensional shape measurement including connection between three-dimensional data. [Solution] A three-dimensional measurement device for measuring a three-dimensional shape of an object to be measured is characterized by being provided with: an image capturing unit that captures an image of the object to be measured; a detection unit that detects a feature region of the object to be measured on the basis of the image of the object to be measured, the image being captured by the image capturing unit; a notification unit that notifies a user of feature region information based on a result detected by the detection unit; and a measurement unit that calculates the three-dimensional shape of the object to be measured on the basis of a plurality of images of the object to be measured, the images being captured by the image capturing unit.

Inventors:
SASAKI HIDEKI (JP)
KOKUMAI YUJI (JP)
Application Number:
PCT/JP2015/050787
Publication Date:
July 21, 2016
Filing Date:
January 14, 2015
Export Citation:
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Assignee:
NIKON CORP (JP)
International Classes:
G01B11/25
Foreign References:
JP2011075336A2011-04-14
JP2000180137A2000-06-30
JP2011047863A2011-03-10
JP2013079960A2013-05-02
JP2012093234A2012-05-17
Attorney, Agent or Firm:
NISHI, Kazuya et al. (JP)
West Kazuya (JP)
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