Title:
TOLERANCE ANALYSIS SYSTEM
Document Type and Number:
WIPO Patent Application WO/2022/168506
Kind Code:
A1
Abstract:
A tolerance analysis system including: a recording unit that records QCD information and variation factors for a workpiece; a dimensional error calculation unit that calculates, from the variation factors, the dimensional error of the workpiece after machining; a data interpolation unit that interpolates data from the calculation result obtained by the dimensional error calculation unit; and a tolerance information generation unit that generates tolerance information from the output from the data interpolation unit and assigns QCD information related to the tolerance information from among the QCD information.
Inventors:
TOHEI TOMOTAKE (JP)
KONO IPPEI (JP)
YAMADA YU (JP)
HARIYAMA TATSUO (JP)
KONO IPPEI (JP)
YAMADA YU (JP)
HARIYAMA TATSUO (JP)
Application Number:
PCT/JP2021/048705
Publication Date:
August 11, 2022
Filing Date:
December 27, 2021
Export Citation:
Assignee:
HITACHI LTD (JP)
International Classes:
G06F30/20
Domestic Patent References:
| WO2007020679A1 | 2007-02-22 |
Foreign References:
| JP2019091196A | 2019-06-13 | |||
| US20150127480A1 | 2015-05-07 |
Attorney, Agent or Firm:
SEIRYO I.P.C. (JP)
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