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Patent Searching and Data


Title:
X-RAY FLUORESCENCE ANALYZER
Document Type and Number:
WIPO Patent Application WO/2021/059597
Kind Code:
A1
Abstract:
This X-ray fluorescence analyzer comprises a quantification means using a fundamental parameter method. For each standard sample, the quantification means uses a measurement intensity, device sensitivity constant, and a proportionality constant, which is multiplied by the mass fraction of a measurement element to calculate a theoretical intensity in a theoretical intensity equation, to calculate a quantitative value for the content of a component corresponding to the measurement element. The quantification means outputs the accuracy of the entirety of quantitative values from a set of used standard samples and a quantification error, a quantitative value, and a standard value for each standard sample and/or a graph indicating the correlation between standard values and quantitative values, for each component.

Inventors:
KATAOKA YOSHIYUKI (JP)
GOTO NAOTO (JP)
Application Number:
PCT/JP2020/022146
Publication Date:
April 01, 2021
Filing Date:
June 04, 2020
Export Citation:
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Assignee:
RIGAKU DENKI CO LTD (JP)
International Classes:
G01N23/223
Domestic Patent References:
WO2018168939A12018-09-20
WO2017038701A12017-03-09
Foreign References:
US20030118148A12003-06-26
Attorney, Agent or Firm:
SUGIMOTO, Shuji et al. (JP)
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