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WO/2022/126840A1 |
Provided in the present invention are a scanning electron microscope sample box system and an opening method therefor, comprising: a sample compartment (1); a switching compartment (2) in communication with the sample compartment (1), a ...
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WO/2022/131151A1 |
The present invention relates to a method for evaluating the compatibility of a thermosetting resin composition containing at least two kinds of resins and an inorganic filler, said method comprising the following steps 1A and 2A. Step 1...
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WO/2022/130376A1 |
An X-Ray-Spectroscopy (XRS) inspection station is presented for inspecting objects progressing on a production line. The XRS station comprises: at least one XRS inspection system each defining an XRS inspection region and performing one ...
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WO/2022/131336A1 |
Provided are a measurement condition search method, a computer program, a measurement condition search device, and a measuring system which enable appropriate measurement conditions to be searched for easily. This method for searching ...
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WO/2022/130703A1 |
Provided is a method for evaluating center segregation of steel, which is excellent in correlation with HIC sensitivity. This steel center segregation evaluation method is characterized in that after a sample having a cross-section inclu...
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WO/2022/132160A1 |
Systems and methods for determining a mass of a crop by using at least one X-ray scanner is provided. The method includes obtaining at least two scan images of the crop, where a first of the at least two images is obtained along a first ...
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WO/2022/121954A1 |
A PCB surface thin layer quality analysis method, comprising the following steps: an automatic sampler uses scissors to remove a required measurement area from a PCB; gold spraying treatment; fixing the test sample onto a metal sample pl...
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WO/2022/120983A1 |
Disclosed are an X-ray phase contrast image extraction method and device, a terminal and a storage medium, the method comprising: on the basis of an X-ray light source, a detector and an object to be measured, constructing a Talbot-Lau p...
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WO/2022/126071A1 |
A three-dimensional x-ray imaging system includes at least one detector and an x-ray source including an x-ray transmissive vacuum window. The x-ray source is configured to produce diverging x-rays emerging from the vacuum window and pro...
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WO/2022/121691A1 |
A detection method, apparatus (500) and system (100). The detection method comprises: obtaining information of at least two first positions through which a particle passes before penetrating an object to be detected, and information of a...
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WO/2022/122056A1 |
The universal loading device for mechanical loading of the object studied (4) during scanning of the internal structure of the object studied (4) by ionizing radiation, in particular for use in tomography scanner, is of a modular design ...
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WO/2022/118948A1 |
Provided is a method for visualizing gaps in a sample whereby it is possible to distinguish between water and organic matter that both have a low X-ray absorption rate. The method for visualizing gaps in a sample involves the use of X-ra...
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WO/2022/118320A1 |
The invention subject of the present application concerns sorting of black plastics.
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WO/2022/118956A1 |
The present invention achieves a magnetization measuring device with which it is easy to maximize the measurement sensitivity or minimize measurement errors, and to set the depth of a measurement target point, of which the magnetization ...
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WO/2022/118585A1 |
Provided is a total internal reflection fluorescent X-ray analyzer having high analysis sensitivity and high analysis speed. The total internal reflection fluorescent X-ray analyzer comprises: an X-ray source having an electron beam foca...
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WO/2022/116861A1 |
A conveying device (100) and an inspection system (1000). The conveying device comprises: a first support frame (1); a first conveying mechanism (2) and a second conveying mechanism (3), which are mounted on the first support frame; and ...
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WO/2022/118150A1 |
A system is disclosed for the inspection, by means of X-rays, of a conveyor belt comprising a plurality of metal wires disposed longitudinally in the interior thereof and a location for inspection; the system comprising: a fixed structur...
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WO/2022/118957A1 |
Achieved is a magnetization measurement method that enables measurement of the internal magnetization of a magnetic body. A magnetization measurement method (M) includes: converting step (M4, M10) for converting, into linearly polarized ...
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WO/2022/111889A1 |
The invention relates to a method and a device for inspecting a weld seam in an assembly of an optical system for microlithography, the method comprising the following steps: performing at least one CT measurement at the weld seam (14), ...
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WO/2022/114764A1 |
The present invention relates to a detail restoration and tone mapping network device for X-ray inspection. According to the present invention, a detail restoration and tone mapping network device for X-ray inspection may be provided, th...
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WO/2022/111905A1 |
Disclosed is a metrology apparatus and method for measurement of a diffractive structure on a substrate. The metrology apparatus comprises a radiation source operable to provide first radiation for excitation of the diffractive structure...
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WO/2022/109866A1 |
An apparatus comprises: an X-ray source (101); an X-ray detector (100); the X-ray source (101) is configured to direct an X-ray beam (102) toward a surface (104) at a glancing angle (108) at which the X-ray beam (102) undergoes total ext...
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WO/2022/110509A1 |
A method for determining a dislocation slip type, which is specifically as follows: first manufacturing an EBSD block sample, calibrating the crystal orientation by means of EBSD, and using Vickers hardness indenters having different loa...
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WO/2022/113416A1 |
This X-ray phase imaging device (100) comprises an X-ray source (1), an X-ray detector (2), a plurality of gratings, a subject placement part (21) that is disposed within an X-ray irradiation range and upon which a subject (90) is placed...
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WO/2022/113533A1 |
[Problem] To provide a rotation mechanism for an X-ray examination device that can bring a trajectory of rotation of a rotating examination subject close to a perfect circle. [Solution] In this rotation mechanism for an X-ray examination...
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WO/2022/115519A1 |
A system for detecting gold in a sample using X-ray fluorescence can comprise an X-ray device having an X-ray tube assembly. The X-ray tube assembly can comprise a target material. The target material can comprise uranium (e.g., U-238). ...
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WO/2022/113481A1 |
A counting-time calculating means (13) included in an X-ray fluorescence analysis device of the present invention calculates, assuming that the overall precision of the X-ray intensity is a counting precision due to statistical fluctuati...
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WO/2022/107148A1 |
Measurement system and method are presented for determining spatial distribution of chemical elements in a sample. The system comprises a measurement unit and a control system. The measurement unit is adapted to produce primary radiation...
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WO/2022/108249A1 |
The present invention relates to a method, apparatus, and program for generating training data, wherein a foreign substance image is precisely inserted into a non-defective product image by utilizing an X-ray attenuation formula, thus ma...
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WO/2022/105404A1 |
Provided is a radiographic inspection device, comprising: a plurality of inspection channels, a scanning apparatus, a driving apparatus and a controller. The plurality of inspection channels are arranged side by side, and each inspection...
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WO/2022/107476A1 |
[Problem] To provide an X-ray inspection device that, when a plurality of X-ray images are acquired that are to be combined and used to generate a CT image, is capable of suppressing variation in the angle of an object under inspection i...
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WO/2022/108250A1 |
A problem to be solved by the present invention relates to a deep learning-based high image quality x-ray image generation method, apparatus, and program, wherein a high image quality x-ray image can be quickly obtained by inputting x-ra...
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WO/2022/108605A1 |
The present specification describes a system for synchronizing a transmission detector and a backscatter detector integrated with a portable X-ray scanner. The system includes a transmitter connected with the transmission detector for tr...
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WO/2022/102821A1 |
A method for selectively correcting an electron backscatter diffraction pattern (EBSP) according to the present invention comprises: (a) a step of preprocessing the EBSP; (b) an image transformation step of representing a diffraction ban...
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WO/2022/102153A1 |
This X-ray fluorescence analyzer comprises a sample base that has an opening formed therein and upon which a sample is placed so as to be exposed from the opening, an X-ray source that irradiates primary X-rays through the opening and on...
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WO/2022/103952A1 |
Provided herein are methods and systems for improved material sample analysis and quality control. A computing device may receive sample data associated with a plurality of material samples. The computing device may determine a first sub...
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WO/2022/096318A1 |
The invention relates to a method for classifying unknown particles on a surface of a semi-conductor wafer, comprising: applying particles of a known chemical composition and varying size onto a test wafer; determining the size of a plur...
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WO/2022/098215A1 |
The present invention provides a battery receiving apparatus comprising: a body which has an electrical terminal exposed on one surface thereof and provides a battery accommodation space; and a battery accommodation space cover which has...
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WO/2022/096025A1 |
A comprehensive testing device for the impact of an external field on physical properties of a gas hydrate, relating to the field of gas hydrate testing. The device comprises a gas-liquid supply unit, a temperature control unit, a reacti...
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WO/2022/094616A1 |
A pipe inspection system (100) includes a portable x-ray scanner(102) that can output a scanning beam of x-rays (104); a transmission detector module (106) that can detect x-rays of the scanning beam that are transmitted through a pipe (...
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WO/2022/088688A1 |
The present invention provides an X-ray automatic inspection device and method for inspecting the quality of a transformer coil. The device comprises a rotating platform, a base, a coil tray, telescopic electric hanging frames, an X-ray ...
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WO/2022/091749A1 |
Provided are a radiation detection module in which a plurality of radiation detection elements can be brought close to a radiation source, and a radiation detection device. The radiation detection module includes a block and a pluralit...
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WO/2022/091180A1 |
This charged particle beam device comprises: a charged particle optical system for emitting a pulsed charged particle beam onto a sample; an optical system for emitting light onto the sample; a detector for detecting secondary charged pa...
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WO/2022/092060A1 |
Provided is an X-ray optical device (1) comprising: a first reflective convex surface (21) that reflects X-rays; and a second reflective convex surface (22) that reflects X-rays. The first reflective convex surface (21) and the second re...
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WO/2022/091597A1 |
A fluorescent X-ray analysis device according to the present invention is provided with: a determining means (21) for determining, for all measurement rays, which are secondary X-rays of which the intensity is to be measured, whether the...
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WO/2022/093679A1 |
Described herein are examples of torch tracking systems that monitor travel directions, speeds, and/or distances of welding torches using retractable cords. In some examples, the torch tracking systems use a sensor to measure a speed at ...
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WO/2022/091598A1 |
An excluding means (21) with which a fluorescent X-ray analysis device according to the present invention is provided: calculates an adhesion amount for a component of which a measurement element is not included in a base layer, on the a...
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WO/2022/091234A1 |
The purpose of the present invention is to resolve a trade-off among throughput, SNR, and spatial resolution in a charged particle beam device. For this purpose, a computer 18 sets a charged particle optical system or a detection system ...
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WO/2022/085275A1 |
This imaging unit comprises a housing having an incident window that allows radiation that has passed through an object to pass through, a scintillator having an input surface that inputs radiation that has passed through the incident wi...
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WO/2022/082991A1 |
A high-resolution in-situ suspension-type temperature difference and voltage applying chip for a transmission electron microscope and a preparation method therefor. The chip comprises a substrate (1) with two faces covered with insulatin...
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