Title:
改良型電子部品ハンドラー試験プレート
Document Type and Number:
Japanese Patent JP2011503619
Kind Code:
A
Abstract:
An improved electronic component handler and associated improved test plate are shown. A guide on the test plate is used to intersect the testing apertures to eliminate misalignment of the component loading frame and the aperture to ensure easy insertion of components into the test apertures.
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Inventors:
Bo, Gerald, F.
Application Number:
JP2010534152A
Publication Date:
January 27, 2011
Filing Date:
November 13, 2008
Export Citation:
Assignee:
Electro Scientific Industries, Inc.
International Classes:
G01R31/26
Domestic Patent References:
| JP2000501174A | 2000-02-02 | |||
| JPS49115664A | 1974-11-05 | |||
| JPS61116673A | 1986-06-04 | |||
| JP2000501174A | 2000-02-02 | |||
| JPS49115664A | 1974-11-05 |
Attorney, Agent or Firm:
Tetsuya Mori
Hide Tanaka Tetsu
Ichi Hirose
Hide Tanaka Tetsu
Ichi Hirose