Title:
ELECTRONIC CIRCUIT AND OVERHEAT DETECTION METHOD
Document Type and Number:
Japanese Patent JP2018129969
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide an electronic circuit and an overheat detecting method capable of detecting a temperature rise of a heat generating component without providing a special temperature detecting element.SOLUTION: An electronic circuit 1 has a power semiconductor Q1, which is a heat generating component, mounted on a substrate 10, includes: a tin wiring portion SP1 made of tin or a wiring material including tin provided in a part of a wiring pattern 20 which is a current path of a current flowing through the power semiconductor Q1; a voltage detecting section 4 for detecting a resistance value of the tin wiring portion SP1 as a voltage drop value by the tin wiring portion SP1; and an overheat judging section 5 for judging abnormal overheat of the power semiconductor Q1 on the basis of the voltage drop value detected by the voltage detecting section 4.SELECTED DRAWING: Figure 1
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Inventors:
ASHIKAGA TORU
Application Number:
JP2017022760A
Publication Date:
August 16, 2018
Filing Date:
February 10, 2017
Export Citation:
Assignee:
SANKEN ELECTRIC CO LTD
International Classes:
H02H5/04; G01K7/22; H02H7/00
Domestic Patent References:
| JP2009165285A | 2009-07-23 | |||
| JPH04308416A | 1992-10-30 | |||
| JP2003188697A | 2003-07-04 | |||
| JPS61128131A | 1986-06-16 | |||
| JP2010158896A | 2010-07-22 | |||
| JP2006261464A | 2006-09-28 | |||
| JP2015077030A | 2015-04-20 | |||
| JP2013257248A | 2013-12-26 |
Attorney, Agent or Firm:
Shiroyuki Hori
Yukihiko Maejima
Yukihiko Maejima