Title:
OPTICAL INSPECTION DEVICE AND OPTICAL INSPECTION SYSTEM
Document Type and Number:
Japanese Patent JP2018155598
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide an optical inspection device and an optical inspection system with which it is possible to visually confirm a test image, information about foreign matter and a test result in test mode at the same time.SOLUTION: An X-ray inspection device 1 comprises an inspection unit 11 for determining the presence of foreign matter on the basis of an X-ray transmitted image that is generated by irradiating an article with an X-ray and a mode switching unit 12 for switching between an inspection mode for performing regular inspection by the inspection unit and a test mode for confirming the accuracy of inspection, and further includes a storage unit 13 for storing information pertaining to foreign matter that is used in the test mode, a test image that is an X-ray transmitted image of an article in which foreign matter is mixed, and the determination result of presence of foreign matter executed on the basis of the test image in association with each other, and a display control unit 14 for causing an aggregation screen to be displayed by a display operation unit 8, in which the information pertaining to foreign matter, the test image and the determination result that are associated with each other are aggregated.SELECTED DRAWING: Figure 2
Inventors:
YURUGI FUTOSHI
SUHARA KAZUHIRO
SUHARA KAZUHIRO
Application Number:
JP2017052660A
Publication Date:
October 04, 2018
Filing Date:
March 17, 2017
Export Citation:
Assignee:
ISHIDA SEISAKUSHO
International Classes:
G01N23/04; G01N21/88; G01N23/083; G01N23/18
Domestic Patent References:
| JP2009031149A | 2009-02-12 | |||
| JP2005003481A | 2005-01-06 | |||
| JP2006322750A | 2006-11-30 | |||
| JP2016114416A | 2016-06-23 | |||
| JP2007232586A | 2007-09-13 | |||
| JP2009183818A | 2009-08-20 |
Foreign References:
| WO2008111522A1 | 2008-09-18 |
Attorney, Agent or Firm:
Yoshiki Hasegawa
Yoshiki Kuroki
Kenichi Shibayama
Makoto Takaguchi
Yoshiki Kuroki
Kenichi Shibayama
Makoto Takaguchi