Title:
IMPULSE VOLTAGE TESTING DEVICE
Document Type and Number:
Japanese Patent JP2019022407
Kind Code:
A
Abstract:
To provide an impulse voltage testing device capable of applying suitable voltage to a test object apparatus including an inductance.SOLUTION: An impulse voltage testing device 100 is a testing device 100 for applying impulse voltage to a test object apparatus 101. The impulse voltage testing device 100 includes a discharge gap Gs and a blocking unit 8 for inserting a blocker between electrodes of the discharge gap GS after starting discharge in the discharge gap to block arc discharge. A driving mechanism for driving the blocker is configured so as to change a position of a second shielding plate relatively to a position of a first shielding plate. The first shielding plate is fixed. The driving mechanism includes a motor for rotating the second shielding plate.SELECTED DRAWING: Figure 1
Inventors:
ISHIKURA TAKAHIKO
AONO ICHIRO
SHIBATA TAKUKI
AONO ICHIRO
SHIBATA TAKUKI
Application Number:
JP2017141669A
Publication Date:
February 07, 2019
Filing Date:
July 21, 2017
Export Citation:
Assignee:
MITSUBISHI ELECTRIC CORP
International Classes:
H02M9/04
Attorney, Agent or Firm:
Fukami patent office