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Title:
PHASE DIFFERENCE IMAGE INSPECTION DEVICE AND PHASE DIFFERENCE IMAGE INSPECTION METHOD
Document Type and Number:
Japanese Patent JP2019105703
Kind Code:
A
Abstract:
To provide an effective support means for a "functional diagnostic method" by using a phase difference microscope as a microinterferometer for non-staining real time inspection of living cells such as cancer cells and making use of superiority in a detail observation of its function by comparing it with a conventional inspection device.SOLUTION: A higher order light and a zeroth order light of a captured scattered diffraction light are continuously made to interfere with each other by a filter, and the observed data of the change phenomena including an extracellular appearance change phenomena (A) consisting of an extracellular appearance shape (A1) and the cell size (A2) of the cells that change every moment, and the intracellular structure change phenomena (B) consisting of an intracellular shape (B1) and the intracellular organelle size (B2) are acquired each time, and the interference image imaged on the basis of any change or change phenomena is obtained.SELECTED DRAWING: Figure 6

Inventors:
SHIMIZU ISAO
NOGUCHI MASAYUKI
Application Number:
JP2017237319A
Publication Date:
June 27, 2019
Filing Date:
December 12, 2017
Export Citation:
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Assignee:
RESEARCH INSTITUTE OF ADVANCED TECH CO LTD
International Classes:
G02B21/00; G02B21/14; G02B21/36
Domestic Patent References:
JP2017129760A2017-07-27
JP2017016628A2017-01-19
JP2011239778A2011-12-01
JP2016184224A2016-10-20
JP2014504882A2014-02-27
JP2017205053A2017-11-24
JPH06225220A1994-08-12
JPH06237917A1994-08-30
Foreign References:
WO2007139201A12007-12-06
Attorney, Agent or Firm:
Nichimine International Patent Office