Title:
INSPECTION DEVICE, INSPECTION METHOD, AND PROGRAM FOR INSPECTION DEVICE
Document Type and Number:
Japanese Patent JP2019197030
Kind Code:
A
Abstract:
To provide an inspection device capable of robustly inspecting an inspection object against an influence of fluttering and expansion and contraction of the inspection object, an inspection method, and a program for the inspection device.SOLUTION: An inspection apparatus 10 acquires (S1) image data obtained by photographing an inspection target P, generates (S2) a contour image 31 from the image data, extracts (S3) an outer circumference c of a portion of the inspection target P from the contour image, generates (S4) an inspection region r from the outer circumference c, and inspects (S5) the image data in the inspection region r.SELECTED DRAWING: Figure 4
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Inventors:
SUEHIRO KOICHI
Application Number:
JP2018092487A
Publication Date:
November 14, 2019
Filing Date:
May 11, 2018
Export Citation:
Assignee:
DAINIPPON PRINTING CO LTD
International Classes:
G01N21/892; B65B57/02
Domestic Patent References:
| JP2008233107A | 2008-10-02 | |||
| JPH0894541A | 1996-04-12 | |||
| JP2007155405A | 2007-06-21 | |||
| JPH09311031A | 1997-12-02 | |||
| JPH074937A | 1995-01-10 |
Foreign References:
| US5588068A | 1996-12-24 |
Attorney, Agent or Firm:
Patent Business Corporation Intect International Patent Office
Kazuyuki Oku
Kazuyuki Oku