Title:
ANALYZER
Document Type and Number:
Japanese Patent JP2019211303
Kind Code:
A
Abstract:
To provide an analyzer which can accurately detect sample components in a container and the position of the boundary surface between the sample components without using a plurality of light sources.SOLUTION: The analyzer according to the present invention specifies layers of at least one sample component contained in a container to be separate from the sample in the container, by irradiating the container with light and specifying the wavelength when the light having passed through the sample has the largest intensity on a layer-by-layer basis.SELECTED DRAWING: Figure 4C
Inventors:
SUGIYAMA KIYOTAKA
TSUJIMURA NAOTO
TAMURA KAZUMA
TSUJIMURA NAOTO
TAMURA KAZUMA
Application Number:
JP2018106834A
Publication Date:
December 12, 2019
Filing Date:
June 04, 2018
Export Citation:
Assignee:
HITACHI HIGH TECH CORP
International Classes:
G01N35/10
Domestic Patent References:
| JP2016061585A | 2016-04-25 | |||
| JP2005516212A | 2005-06-02 | |||
| JP2006010453A | 2006-01-12 | |||
| JP2005502877A | 2005-01-27 | |||
| JPH02195261A | 1990-08-01 | |||
| JP2016090250A | 2016-05-23 | |||
| JP2007255918A | 2007-10-04 | |||
| JP2003014641A | 2003-01-15 |
Foreign References:
| US20170138790A1 | 2017-05-18 |
Attorney, Agent or Firm:
Hiraki International Patent Office