Title:
周波数特性評価装置、Sパラメータ測定器、および周波数特性評価装置用のプログラム
Document Type and Number:
Japanese Patent JP4420217
Kind Code:
B2
Inventors:
Keitaro Yamagishi
Hideyuki Ohashi
Hideyuki Ohashi
Application Number:
JP2004257251A
Publication Date:
February 24, 2010
Filing Date:
September 03, 2004
Export Citation:
Assignee:
Mitsubishi Electric Corporation
International Classes:
G01R27/28
Domestic Patent References:
| JP11166952A | ||||
| JP10197577A | ||||
| JP2001230638A | ||||
| JP11311648A | ||||
| JP62226051A |
Foreign References:
| WO2003019207A1 |
Attorney, Agent or Firm:
Michiharu Soga
Hidetoshi Furukawa
Suzuki Kenchi
Kajinami order
Hidetoshi Furukawa
Suzuki Kenchi
Kajinami order