Title:
差分走査熱量計における接触熱抵抗を調整するシステムおよび方法
Document Type and Number:
Japanese Patent JP4482281
Kind Code:
B2
Abstract:
A system and method for obtaining the contact thermal resistance for a sample and pan without a priori knowledge of the properties of either sample, by measuring the reversing heat capacity of a sample and its pan (or an empty pan on the reference side of the DSC) at a long period and a short period during a quasi-isothermal MDSC experiment and then finding the value of contact thermal resistance that makes the short and long period heat capacities match. Several different methods may be used to find the contact thermal resistance using quasi-isothermal MDSC with a long and a short period. Two methods are direct calculation methods that use the results from an MDSC experiment used with model equations to calculate the contact thermal resistance. A third method is another direct calculation method, based upon the phase angle between the heat flow and temperature signals. A fourth and fifth method use curve fitting of the apparent heat capacity for multiple values of pan contact thermal resistance.
Inventors:
Robert El. Dunley
Application Number:
JP2003052451A
Publication Date:
June 16, 2010
Filing Date:
February 28, 2003
Export Citation:
Assignee:
Waters Investments Limited
International Classes:
G01N25/20; G01K17/00
Domestic Patent References:
| JP2001349855A | ||||
| JP2001305086A | ||||
| JP2001330575A | ||||
| JP7280761A |
Attorney, Agent or Firm:
Eio Furuya
Tadashi Matsushita
Hiroaki Majima
Tsurumoto Yoshifumi
Tadashi Matsushita
Hiroaki Majima
Tsurumoto Yoshifumi
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