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Title:
デバイスの特性調整装置及びその特性調整方法
Document Type and Number:
Japanese Patent JP4495397
Kind Code:
B2
Abstract:

To surely and easily perform characteristics adjustment of a device in a short time without damaging the substrate of a device or a circuit pattern.

The characteristics adjusting apparatus comprises a vacuum vessel 11 which houses a superconducting band pass filter 10 and acts as a housing means for realizing a vacuum state, a refrigerator 12 which is a cooling means for cooling the superconducting band pass filter 10, a network analyzer 13 of a measuring means for measuring the electric characteristics of the superconducting band pass filter 10, an ion beam source 14 which is arranged above the vacuum vessel 11 and irradiates a circuit pattern 10a of the superconducting band path filter 10 with an argon ion, and a controller 15 of a control means for controlling the operation of the network analyzer 13 and the ion beam source 14.

COPYRIGHT: (C)2004,JPO&NCIPI


Inventors:
Akihiko Akasegawa
Kazunori Yamanaka
Teru Nakanishi
Application Number:
JP2002375107A
Publication Date:
July 07, 2010
Filing Date:
December 25, 2002
Export Citation:
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Assignee:
富士通株式会社
International Classes:
H01L39/24; H01L39/00; H01P11/00
Domestic Patent References:
JP6077543A
JP11186624A
JP7254734A
Attorney, Agent or Firm:
Takayoshi Kokubun