Title:
測定装置、試験装置、及び測定方法
Document Type and Number:
Japanese Patent JP4644132
Kind Code:
B2
Abstract:
The measurement device has a high frequency pass stage (60) for enabling a high frequency component of the input signal in a first band to pass, a reference voltage divider stage (32), a signal voltage divider stage (26), a low frequency pass stage (70) for passing a low frequency component of a difference signal, a (80) stage for combining the low frequency and high frequency divider stage output signals and a measurement stage for measuring the combined signal.. Independent claims are also included for the following: (A) a test device (B) and a measurement method of measuring input signal voltage level fluctuations.
Inventors:
Seiji Amana
Kiyoharu Suzuki
Kiyoharu Suzuki
Application Number:
JP2006023273A
Publication Date:
March 02, 2011
Filing Date:
January 31, 2006
Export Citation:
Assignee:
Advantest Corporation
International Classes:
G01R31/28
Domestic Patent References:
| JP2002107406A | ||||
| JP10232266A |
Attorney, Agent or Firm:
Longhua International Patent Service Corporation
Akihiro Ryuka
Akihiro Ryuka