Title:
改良校正及び通信プロセスを有するアナライト検査器具
Document Type and Number:
Japanese Patent JP4749549
Kind Code:
B2
Abstract:
An analyte test instrument having improved calibration and communication processes. The instrument employs a calibration method that allows it to communicate with any one of a plurality of data storage strips. A data storage strip including a memory device is inserted into the test port of the instrument. The data storage strip is identified, and the instrument establishes communications with the data storage strip using a protocol corresponding to the data storage strip. Second, the instrument employs a method for ensuring that the instrument is operated using valid calibration strips and test strips. The instrument determines whether one or more of test parameters stored in the instrument is invalid for a test strip inserted into the test port of the instrument. If a test parameter is invalid, an indication of the invalid strip parameter is displayed on the display. Finally, the instrument utilizes a method for determining the actual date and time of events that occurred before the instrument was provided with current date and time.
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Inventors:
Deweiss, Marshall Day
Karaya Nopoulos, Leonidas
Parkes, Joel M
Ames, William H
Karaya Nopoulos, Leonidas
Parkes, Joel M
Ames, William H
Application Number:
JP2000585657A
Publication Date:
August 17, 2011
Filing Date:
November 17, 1999
Export Citation:
Assignee:
ABBOTT LABORATORIES
International Classes:
G01N27/416; G01N33/483; G01N27/26; G01N27/28; G01N33/487; G01N35/00
Domestic Patent References:
| JPH0968533A | 1997-03-11 | |||
| JPH05164735A | 1993-06-29 | |||
| JPH07128338A | 1995-05-19 | |||
| JPH07209242A | 1995-08-11 |
Attorney, Agent or Firm:
Yoshio Kawaguchi
Makoto Ono
Akio Ichiiri
Katsuma Osaki
Takamasa Soma
Makoto Ono
Akio Ichiiri
Katsuma Osaki
Takamasa Soma