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Title:
レイアウト設計システムおよび半導体集積回路装置の設計方法
Document Type and Number:
Japanese Patent JP4810451
Kind Code:
B2
Abstract:

To drastically reduce violation in timing analysis after a layout design to drastically reduce a period of layout correction in a logic circuit and a rework of a logic design stage.

A logic connection information extraction part 3 extracts logic connection information from a logic circuit diagram stored in a logic circuit diagram storage part 2, and a layout editing part 5 performs the layout design according to the logic connection information. At that time, an RC extraction part 7 extracts parasitic capacity or parasitic resistance of laid out wiring, and a comparison part 9 compares it with a parasitic resistance value or a parasitic capacity value extracted by the logic connection information extraction part 3. When an RC value/violation information generation part 10 decides that the parasitic capacity or the parasitic resistance extracted by the RC extraction part 7 is larger than the parasitic resistance value or the parasitic capacity value extracted by the logic connection information extraction part 3, the RC value/violation information generation part 10 generates error information, and displays the error information on a layout diagram of a display part 11 through the layout editing part 5 to design the layout in conformity to restriction added in the logic design stage.

COPYRIGHT: (C)2008,JPO&INPIT


Inventors:
Minoru Ikeda
Application Number:
JP2007023287A
Publication Date:
November 09, 2011
Filing Date:
February 01, 2007
Export Citation:
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Assignee:
Renesas Electronics Corporation
International Classes:
G06F17/50
Domestic Patent References:
JP2002366601A
JP11175580A
JP5067680A
JP4042374A
Attorney, Agent or Firm:
Yamato Tsutsui