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Title:
パノラマ断層像生成装置及びパノラマ断層像生成プログラム
Document Type and Number:
Japanese Patent JP4823780
Kind Code:
B2
Abstract:

To provide an X-ray measuring instrument capable of obtaining a panorama tomographic image having a thickness in the direction (the depth direction) perpendicular to a body axis of a subject.

The orbit 401 of a panorama tomographic image forming area is set with a function, and a first point to be noted 402 is set on the orbit at prescribed interval, and also a second point to be noted 503 is set on a line through which the point to be noted 402 and the deployment center 400 are connected. An X-ray source position 404 where the normal 403 of the orbit 401 passes, and a position 406 on a detector 405 are obtained concerning the first point to be noted, and data within an angular range around the positions are added by weighting so as to be defined as tomographic data of the first point to be noted 402. The same processing is performed relative to the second point to be noted so as to obtain the tomographic data of the second point to be noted 503. The kinds of tomographic data are added by weighting so as to be defined as the final tomographic data of the first point to be noted 402. The same processing is performed relative to the points to be noted on the orbit 401 and the final tomographic data of each point to be noted are made to be stuck together, so that panoramic image data is generated.

COPYRIGHT: (C)2008,JPO&INPIT


Inventors:
Rika Baba
Ken Ueda
Application Number:
JP2006168994A
Publication Date:
November 24, 2011
Filing Date:
June 19, 2006
Export Citation:
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Assignee:
Hitachi Medical Co., Ltd.
International Classes:
A61B6/14
Domestic Patent References:
JP9140701A
JP2001061834A
JP61026507U
Foreign References:
WO2003084407A1
WO2005091219A1
Attorney, Agent or Firm:
Yusuke Hiraki



 
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