Title:
試験方法,試験プログラム,及び試験装置
Document Type and Number:
Japanese Patent JP5565340
Kind Code:
B2
Abstract:
A method for testing data, has writing, in a first area of the test-target area, a test pattern, transferring, to a second area of the test-target area, the test pattern that has been written in the first area, transferring, to the first area, the test pattern that has been transferred to the second area, using as a transfer start address an address that is shifted by a predetermined amount, and inspecting whether or not the data is correctly written in and read from the test-target area by comparing the base patterns disposed next to each other in the base-pattern pair included in the test pattern that has been transferred from one of the first area and the second area to the other of the first area and the second area and by determining whether or not the base patterns disposed next to each other are identical to one another.
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Inventors:
Onuma Tadashi
Application Number:
JP2011038292A
Publication Date:
August 06, 2014
Filing Date:
February 24, 2011
Export Citation:
Assignee:
富士通株式会社
International Classes:
G11C29/12; G06F12/16; G11C29/10
Domestic Patent References:
| JP10207787A | ||||
| JP7287673A | ||||
| JP2001250400A | ||||
| JP11272566A | ||||
| JP6150699A | ||||
| JP2009043389A | ||||
| JP3016353A |
Foreign References:
| US20070089006 |
Attorney, Agent or Firm:
Yu Sanada
Masahisa Yamamoto
Masahisa Yamamoto