Title:
トランジスタアレイの改善されたテスト方法及びテストシステム
Document Type and Number:
Japanese Patent JP5840340
Kind Code:
B2
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Inventors:
Raji Bee Apte
Application Number:
JP2009045371A
Publication Date:
January 06, 2016
Filing Date:
February 27, 2009
Export Citation:
Assignee:
Palo Alto Research Center Incorporated
International Classes:
G01R31/00; G02F1/13; G02F1/1368
Domestic Patent References:
| JP643490A | ||||
| JP2000113684A | ||||
| JP2003208798A | ||||
| JP1251016A | ||||
| JP2002503358A | ||||
| JP2007286402A | ||||
| JP6284490A | ||||
| JP2007503640A |
Attorney, Agent or Firm:
Patent Corporation yki International Patent Office