Title:
磁場計測方法及び磁場計測装置
Document Type and Number:
Japanese Patent JP6597034
Kind Code:
B2
Abstract:
In a magnetic field measurement apparatus, a light source irradiates a gas cell with linearly polarized light serving as pump light and probe light in a Z axis direction, and a magnetic field generator applies alternating magnetic fields which have the same cycle and different phases to the gas cell in each of X axis and Y axis directions. A calculation controller calculates a magnetic field C (Cx, Cy, Cz) of a measurement region using X axis and Y axis components Ax and Ay of the alternating magnetic fields, and a spin polarization degree Mx corresponding to a measurement value W from a magnetic sensor.
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Inventors:
Kimio Nagasaka
Mitsutoshi Miyasaka
Satoshi Takahashi
Mitsutoshi Miyasaka
Satoshi Takahashi
Application Number:
JP2015154818A
Publication Date:
October 30, 2019
Filing Date:
August 05, 2015
Export Citation:
Assignee:
Seiko Epson Corporation
International Classes:
G01R33/26; A61B5/05; G01R33/02; G01R33/032
Domestic Patent References:
| JP2007167616A | ||||
| JP2014215151A |
Foreign References:
| US5272436 |
Attorney, Agent or Firm:
Yukio Fuse
Mitsue Obuchi
Kazuaki Watanabe
Satoshi Nakai
Mitsue Obuchi
Kazuaki Watanabe
Satoshi Nakai