Title:
構造物計測装置、計測点補正装置、および計測点補正方法
Document Type and Number:
Japanese Patent JP6641535
Kind Code:
B2
Abstract:
Each of the interior of a first measurement surface (26) and the interior of a second measurement surface (28) traveling together with a measuring vehicle (1) is scanned to acquire first measurement coordinate points and second measurement coordinate points. A first comparison point cloud representing a comparison part on a surface of a structure is extracted from the first measurement coordinate points. A second comparison point cloud representing a comparison part on the surface of the structure is extracted from the second measurement coordinate points. A difference between the first comparison point cloud and the second comparison point cloud corresponding to measurement of a common comparison part on the surface of the structure is calculated. Error having time dependence included in the first measurement coordinate points and the multiple second measurement coordinate points is calculated on the basis of the calculated difference. The measurement coordinate points are corrected on the basis of the calculated error.
Inventors:
Katsuyuki Kamei
Masashi Watanabe
Hiroyuki Fujibayashi
Megumi Irie
Masashi Watanabe
Hiroyuki Fujibayashi
Megumi Irie
Application Number:
JP2019533734A
Publication Date:
February 05, 2020
Filing Date:
July 31, 2017
Export Citation:
Assignee:
Mitsubishi Electric Corporation
International Classes:
G01C7/04
Domestic Patent References:
| JP2016206131A | ||||
| JP20122783A |
Foreign References:
| US20170044728 |
Attorney, Agent or Firm:
Yoshitake Hidetoshi
Takahiro Arita
Takahiro Arita