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Title:
リソグラフィ装置及びデバイス製造方法
Document Type and Number:
Japanese Patent JP6697563
Kind Code:
B2
Abstract:
A lithographic apparatus is described, the lithographic apparatus comprising: - an illumination system (IL) configured to condition a radiation beam; - a support (SA2) constructed to support a patterning device (MA), the patterning device being capable of imparting the radiation beam with a pattern in its cross-section to form a patterned radiation beam (PR); - a projection system (PS) configured to project the patterned radiation beam onto a target portion of a substrate (W), - a stage assembly (SA) comprising: - a substrate table (WT) constructed to hold the substrate; and - a positioning device configured to displace the substrate table relative to the projection system; - a base frame onto which stage assembly and the projection system are mounted; - the base frame comprising a first portion (SABF) configured to support the stage assembly and a second portion (BF2) configured to support the projection system, the first portion and the second portion being connected to each other via a compliant portion (DC) of the base frame.

Inventors:
Butler, hands
De Horn, Cornelius, Adrinus, Lambertus
Jacobs, Franciscus, Matisse
Kagan, Pavel
Star Reveld, Yoroen, Peter
Wikmans, Maurice, Willem, Joseph, Etienne
Application Number:
JP2018533777A
Publication Date:
May 20, 2020
Filing Date:
December 07, 2016
Export Citation:
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Assignee:
AS M Netherlands B.V.
International Classes:
G03F7/20; H01L21/683
Domestic Patent References:
JP2014086524A
JP2012097786A
JP2005183710A
JP2001091681A
JP2004221251A
JP2006344969A
JP2012060117A
Attorney, Agent or Firm:
Yoshiyuki Inaba
Toshifumi Onuki
Akihiko Eguchi
Kazuhiko Naito