A 2 axis four-point bending test device

Title:

A 2 axis four-point bending test device

Document Type and Number:

Japanese Patent JP6003479

Kind Code:

B2

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Inventors:

Shinya Miyazaki

Application Number:

JP2012215526A

Publication Date:

October 05, 2016

Filing Date:

September 28, 2012

Export Citation:

Assignee:

Ihi Co., Ltd.

International Classes:

G01N3/34; G01N3/20

Domestic Patent References:

Attorney, Agent or Firm:

Yamada Patent Office

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