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Patent Searching and Data


Title:
ABNORMALITY DETECTOR
Document Type and Number:
Japanese Patent JP2013191185
Kind Code:
A
Abstract:

To obtain an abnormality detector capable of reliably determining an abnormality of a detection object.

Period detection means 103 analyzes feature quantities of an image extracted by image feature quantity extraction means 102 in time series to detect a variation period of a detection object. Feature quantity model generation means 104 generates an average value of image feature quantities as a standard model by unit of variation period. Abnormality detection means 105 compares the image feature quantities extracted by the image feature quantity extraction means 102 with the image feature quantities of the standard model generated by the feature quantity model generation means 104, and determines that it is an abnormality of the detection object when difference between two feature quantities exceeds a threshold.


Inventors:
OKUMURA SEIJI
MATSUSHITA MASAHITO
Application Number:
JP2012058926A
Publication Date:
September 26, 2013
Filing Date:
March 15, 2012
Export Citation:
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Assignee:
MITSUBISHI ELECTRIC CORP
International Classes:
G06T7/20; G05B23/02; H04N7/18
Attorney, Agent or Firm:
Hideaki Tazawa
Hamada Hatsune
Kume Teruyo
Hideo Kawamura