Title:
AMPLITUDE MEASURING DEVICE AND AMPLITUDE MEASURING METHOD
Document Type and Number:
Japanese Patent JP2023017431
Kind Code:
A
Abstract:
To provide an amplitude measuring device and an amplitude measuring method capable of reducing latency.SOLUTION: The amplitude measuring device includes: a high-pass filter 41 for removing low-frequency components of a periodic waveform; a first squaring circuit 45 for squaring a low-frequency-removed signal which has passed through the high-pass filter 41; a differentiator 43 for differentiating the low-frequency-removed signal; a second squaring circuit 46 for squaring a waveform which has passed through the differentiator 43; and an adder 47 for adding an output signal of the first squaring circuit 45 and an output signal of the second squaring circuit.SELECTED DRAWING: Figure 3
Inventors:
OKADA TAKAO
ANDO TOSHIO
UMEDA KENICHI
OKAMOTO CHIHIRO
KODERA TETSUYUKI
ANDO TOSHIO
UMEDA KENICHI
OKAMOTO CHIHIRO
KODERA TETSUYUKI
Application Number:
JP2021121704A
Publication Date:
February 07, 2023
Filing Date:
July 26, 2021
Export Citation:
Assignee:
RES INSTITUTE OF BIOMOLECULE METROLOGY CO LTD
International Classes:
G01Q60/32; G01Q20/02
Attorney, Agent or Firm:
Hidekazu Miyoshi
Shunichi Takahashi
Masakazu Ito
Toshio Takamatsu
Shunichi Takahashi
Masakazu Ito
Toshio Takamatsu
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