Title:
解析支援プログラム、解析支援装置、および解析支援方法
Document Type and Number:
Japanese Patent JP5664274
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To accurately estimate a correlation distribution of delay values and leak current values of a circuit.SOLUTION: An analysis support device 100 sets a correction value for correcting a value featuring a delay distribution representing variance in delay value of a cell to a variance model for the delay value of the cell. The analysis support device 100 sets a correction value for correcting a value featuring a leak current distribution representing variance in leak current value of a cell to a variance model for the leak current value of the cell. The analysis support device 100 acquires a measured correlation distribution 110 of measured delay values and leak current values of a chip C after manufacture associated with a circuit to be analyzed. The analysis support device 100 calculates correction values set for the respective variance models so that an estimated correlation distribution 120 of delay values and leak current values of the circuit to be analyzed which are calculated using the variance models for the delay values and leak current values of the cell matches the acquired measured correlation distribution 110.
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Inventors:
本間 克己
Application Number:
JP2011012354A
Publication Date:
February 04, 2015
Filing Date:
January 24, 2011
Export Citation:
Assignee:
富士通株式会社
International Classes:
G06F17/50; H01L21/82
Attorney, Agent or Firm:
Akinori Sakai