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Title:
ANALYTICAL METHOD FOR COMPOSITION COMPOSED OF CERAMIC AND OF AMPHOTERIC METAL
Document Type and Number:
Japanese Patent JPH10132801
Kind Code:
A
Abstract:

To obtain an analytical method in which a composition composed of a ceramic and of an amphoteric metal can be analyzed with high accuracy by applying an emission analytical method to a sample solution obtained in such a way that the composition is pulverized and that it is heated and melted inside a crucible together with an alkali flux so as to be changed into a solution by using an acid.

A discal sample whose diameter is 65mm and whose thickness is about 1mm is pulverized so as to be easily dissolved into a solution. Since the hardness of a sample which contains a ceramic is high, a pulverizing container made of tungsten carbide is used, and the sample is pulverized by a vibrating mill. The mesh of a sieve is selected so as to aim at about 60 meshes. The pulverized sample is dried at about 105°C for about two hours in order to remove its adsorbed moisture, and it is cooled down to room temperature in a desciccator. The amount of the sample to be analyzed is sampled in a range of about 0.1 to 0.5g, one gram of sodium hydroxide as a flux is put into a nickel crucible, and the sample is heated and melted by using a gas burner. As a temperature for heating, about 600 to 800°C is selected. After the sample has been melted, the whole amount is set at 200ml, and the sample solution for plasma emission analysis is obtained.


Inventors:
SADO NAOHIKO
SUDA HIROTAKA
Application Number:
JP28720196A
Publication Date:
May 22, 1998
Filing Date:
October 30, 1996
Export Citation:
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Assignee:
FUJI ELECTRIC CO LTD
International Classes:
G01N31/00; G01N1/28; G01N21/73; G01N21/75; (IPC1-7): G01N31/00; G01N1/28; G01N21/73; G01N21/75
Attorney, Agent or Firm:
Iwao Yamaguchi