Title:
検査装置の異常検知システム
Document Type and Number:
Japanese Patent JP7306916
Kind Code:
B2
Abstract:
To provide an abnormality detection method for a test device capable of accurately detecting an abnormality in the test device, and an abnormality detection system for the test device.SOLUTION: An abnormality detection method for a test device T includes: a step of obtaining outputs (F, V and X) of the test device T in the case where a test body D is tested or tested with no load; and a detection step of detecting an abnormality in the test device T based on a difference of feature amounts of present outputs (F, V and X) of the test device T from an average value of feature amounts of past normal outputs (F, V and X) of the test device T. An abnormality detection system 1 for the test device T comprises: a sensor 2 which detects the outputs (F, V and X) of the test device T in the case where the test body D is tested or tested with no load; and a processor 3 which processes the outputs (F, V and X) of the test device T. The processor 3 detects the abnormality in the test device T based on the difference of the feature amounts of the present outputs (F, V and X) of the test device from the average value of the feature amounts of the past normal outputs (F, V and X) of the test device T.SELECTED DRAWING: Figure 1
Inventors:
Yuta Nakamura
Application Number:
JP2019150841A
Publication Date:
July 11, 2023
Filing Date:
August 21, 2019
Export Citation:
Assignee:
KYB Co., Ltd.
International Classes:
G05B23/02; G01M7/04
Domestic Patent References:
| JP2006300613A | ||||
| JP2021025808A | ||||
| JP2004150894A |
Attorney, Agent or Firm:
Ken Ishikawa
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