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Title:
APPARATUS FOR X-RAY EXAMINATION
Document Type and Number:
Japanese Patent JP2001000431
Kind Code:
A
Abstract:

To provide an elevating/descending apparatus for X-ray examination, which is produced relatively inexpensively and is stable during examination which moves the center of gravity.

A disk 11 is installed on the axis 12 of an elevating/descending/ rotating apparatus, said disk 11 having an at least partially circular peripheral surface. The disk 11 is firmly fixed to the apparatus, etc., and at least a pair of rollers 21 and 22 is arranged at an immobile portion 15 and 16 of a substrate. A connecting means 25 is provided to connect the rollers 21 and 22 to the disk, so that when each roller of a first roller pair rotates simultaneously toward a different direction the disk 11 and the body of the apparatus slide vertically, and when each roller of a first roller pair rotates simultaneously toward a same direction the disk 11 and the body of the apparatus rotate a central axis 30.


Inventors:
MELLSTROEM ERIK
STENFORS PER
NARFSTROEM JAN
Application Number:
JP2000170815A
Publication Date:
January 09, 2001
Filing Date:
June 07, 2000
Export Citation:
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Assignee:
SIEMENS ELEMA AB
International Classes:
A61B6/00; A61B6/04; (IPC1-7): A61B6/04; A61B6/00
Attorney, Agent or Firm:
Toshio Yano (3 outside)