Title:
APPEARANCE INSPECTION DEVICE, APPEARANCE INSPECTION METHOD AND INSPECTION PROGRAM
Document Type and Number:
Japanese Patent JP2017090346
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To improve inspection efficiency by appearance inspection.SOLUTION: An appearance inspection device includes: determination means that determines an inspection object portion including an inspection area from a shape characteristic of an inspection image to be obtained by taking a picture of an inspected object; extraction means that extracts the inspection area from the inspection object portion; mask image generation means that generates a second image from a first image about the inspected object with a contracted image by a dimension error and shape error as a mask image; and mask means that masks allowable dimension error and shape error, using the first image and the second image, and thereby obtain an image of an exclusive OR. The appearance inspection device is configured to determine whether the inspected object is good in quality on the basis of the image of the exclusive OR obtained by the mask means.SELECTED DRAWING: Figure 4
Inventors:
YANO TOMOAKI
Application Number:
JP2015223342A
Publication Date:
May 25, 2017
Filing Date:
November 13, 2015
Export Citation:
Assignee:
RICOH CO LTD
International Classes:
G01N21/88; G01B11/00; G01B11/24; G06T1/00
Attorney, Agent or Firm:
Takao Maruyama
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