Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
ASSEMBLY COMMAND AND ASSEMBLY INSPECTION SYSTEM IN INFORMATION PROCESSOR
Document Type and Number:
Japanese Patent JP2009148841
Kind Code:
A
Abstract:

To facilitate assembly work and inspection in an information processor; and a system capable of accurately executing the assembly work and inspection.

This assembly command and inspection system automatically commands assembly work using an automatic assembly indicator (a movable laser pointer) and automatically inspects the assembly using an automatic assembly inspection device (a movable type optical camera). This system automatically commands workers using the automatic assembly indicator and allow them to execute the assembly work without referring to a working plan so as to reduce the manhours of the workers and prevent omission in the work. The assembly inspection is automatically done using the automatic inspection device so as to improve the quality and speed of the inspection. This system automatically and statistically computes inferior working points from the actual assembly inspection result and informs them to the workers so as to reduce the inferior work.


Inventors:
HOSHINO HIROAKI
KIKUCHI KATSUYUKI
FUKUDA YUICHI
Application Number:
JP2007326696A
Publication Date:
July 09, 2009
Filing Date:
December 19, 2007
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
HITACHI LTD
International Classes:
B23P19/00; B23P21/00
Attorney, Agent or Firm:
Manabu Inoue
Yuji Toda