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Title:
ATOMIC FORCE AND MOLECULAR FORCE MICROSCOPE
Document Type and Number:
Japanese Patent JP2004069428
Kind Code:
A
Abstract:

To provide an atomic and molecular force microscope which can conduct atomic force microscopic observation of the reaction of a local site of a biological sample with respect to light stimulus.

The atomic and molecular force microscope is integrated with an inverted microscope 270, including a stage 271, an objective lens 272, a revolver Z-axis moving mechanism 276, an eyepiece 273, an illumination light source 108 and a transmission illuminating unit 274. The microscope further includes a cantilever 207, a displacement detecting unit 230 for the cantilever, and a scanning mechanism 213 for scanning the cantilever 207. The microscope also includes a laser 105, a light intensity/time designating unit 103 for designating the position, region, amount of light and the time of irradiating with a laser beam and an irradiating position/region designating unit 104, an irradiating position/region controller 100 for controlling the position, the region, the amount of light and the time of irradiating with the laser beam, the irradiating time controller 101 and an amount-of-irradiating light controller 102, and an imaging unit 106 for obtaining a fluorescent image of the sample as a whole.


Inventors:
KOBAYASHI SHIGERU
Application Number:
JP2002227569A
Publication Date:
March 04, 2004
Filing Date:
August 05, 2002
Export Citation:
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Assignee:
OLYMPUS CORP
International Classes:
G01N21/64; G01N33/483; G01Q30/02; G01Q60/24; G01Q80/00; (IPC1-7): G01N13/16; G01N21/64
Attorney, Agent or Firm:
Takehiko Suzue
Sadao Muramatsu
Atsushi Tsuboi
Satoshi Kono
Tetsuya Kazama