Title:
Automatic analysis device
Document Type and Number:
Japanese Patent JP5982551
Kind Code:
B2
Abstract:
Provided is an automatic analyzer with high processing capacity which is capable of immediately measuring an emergency specimen rack while reducing complication of a device and increase in a device cost. The automatic analyzer includes a conveying line for conveying a specimen rack which stores a specimen container for holding a specimen, a plurality of analysis units which has a dispensing line in which the plurality of specimen racks arranged along the conveying line and for waiting for sample dispensing is capable of waiting and analyzes and measures components included in the specimen, and a sampling area for dispensing the sample to the analysis unit. A rack evacuation area is provided in the dispensing line and at a position adjacent to the upstream side of the sampling area. When the specimen rack exists in the sampling area at the time of measuring an emergency specimen, a controller moves the specimen rack to the evacuation area and positions the emergency specimen rack from the downstream side of the sampling area to the sampling area.
Inventors:
Akihisa Makino
Hishinuma Mitsuhiro
Toshiyuki Shimamori
Masato Ishizawa
Hishinuma Mitsuhiro
Toshiyuki Shimamori
Masato Ishizawa
Application Number:
JP2015232591A
Publication Date:
August 31, 2016
Filing Date:
November 30, 2015
Export Citation:
Assignee:
Hitachi High-Technologies Corporation
International Classes:
G01N35/02; G01N35/04
Domestic Patent References:
| JP2010526289A | ||||
| JP2008003010A | ||||
| JP2009150859A | ||||
| JP2004279357A | ||||
| JP2007322287A | ||||
| JP3183957A | ||||
| JP3048769A |
Attorney, Agent or Firm:
Manabu Inoue
Yuji Toda
Shigemi Iwasaki
Yuji Toda
Shigemi Iwasaki