Title:
自動顕微鏡の自動焦点調節法及びシステム
Document Type and Number:
Japanese Patent JP5015955
Kind Code:
B2
Abstract:
The invention relates to a method for adjusting focus in an automated microscope. The method may comprise the steps of: providing an optical detector for image acquisition, wherein the optical detector comprises an array of sensor pixels; designating a region of interest in the array of sensor pixels to emulate a confocal aperture; directing a light beam to illuminate an object according to a predefined pattern, thereby forming an image of the illuminated pattern at the optical detector, wherein the image of the illuminated pattern substantially overlaps the designated region of interest; detecting a light intensity from sensor pixels located within the designated region of interest; and adjusting a relative focal position of an objective lens based on the detected light intensity.
Inventors:
Fomitchov, Pavel Aye
Application Number:
JP2008548860A
Publication Date:
September 05, 2012
Filing Date:
December 28, 2006
Export Citation:
Assignee:
GENERAL ELECTRIC COMPANY
International Classes:
G02B7/28; G02B21/00; G02B21/36
Domestic Patent References:
| JP2002258160A | ||||
| JP11142716A | ||||
| JP8327891A | ||||
| JP9218355A |
Attorney, Agent or Firm:
Arakawa Satoshi
Hirokazu Ogura
Toshihisa Kurokawa
Hirokazu Ogura
Toshihisa Kurokawa