Title:
BAR ARRANGEMENT INSPECTION DEVICE, CONTROL METHOD OF THE BAR ARRANGEMENT INSPECTION DEVICE AND BAR ARRANGEMENT INSPECTION PROGRAM
Document Type and Number:
Japanese Patent JP2023125590
Kind Code:
A
Abstract:
To provide a bar arrangement inspection device which measures a distance between a bar arrangement and a reference surface based on image information.SOLUTION: A bar arrangement inspection device (100) according to one embodiment of the present invention comprises: a setting unit (curve setting unit (37)) which sets a guide image that has a reference shape having the symmetric property with a second measurement point as the center when a reference surface faces an imaging unit that images the reference surface and that has a different shape from the reference shape according to the inclination and position of the reference surface; and a generation unit (image generation unit (39)) which generates output image information including a reference surface on which the guide image is drawn.SELECTED DRAWING: Figure 3
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Inventors:
MIZUKI TAKEMITSU
TOKUI KEI
YOSHITAKE KENJI
TOKUI KEI
YOSHITAKE KENJI
Application Number:
JP2022029781A
Publication Date:
September 07, 2023
Filing Date:
February 28, 2022
Export Citation:
Assignee:
SHARP KK
SHIMIZU CONSTRUCTION CO LTD
SHIMIZU CONSTRUCTION CO LTD
International Classes:
G01B11/14; E04G21/12; G06T7/00; G06T7/593
Attorney, Agent or Firm:
HARAKENZO WORLD PATENT & TRADEMARK
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