To provide a calibration method for a three-dimensional shape measuring instrument not requiring an expression of a slit plane, and capable of dispensing thereby with a setting preparation of requiring precision, even in calibration, to be easily carried out, and to provide a three-dimensional shape measuring method using the same.
This calibration method for the three-dimensional shape measuring instrument has: the first step for imaging a state projected with a slit pattern on a plurality of parallel planes with a known interplane distance and different distances from an imaging part; the second step for calculating a parameter of an expression expressing a position and a shape of an image of the slit pattern in every of the planes; and the third step for storing the parameter in every slit while correlating the image of the slit pattern with height coordinates of the observed plane.
OKUDA HARUHISA
MITAMEI YASUO
| JP2002328014A | 2002-11-15 | |||
| JP2000329524A | 2000-11-30 | |||
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| JPS63131007A | 1988-06-03 | |||
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| JP2000161935A | 2000-06-16 |
Hidetoshi Furukawa
Suzuki Kenchi
Kajinami order
Kazuhiro Oyaku
Shunichi Ueda