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Patent Searching and Data


Title:
CHARGED PARTICLE BEAM DEVICE
Document Type and Number:
Japanese Patent JP2014041733
Kind Code:
A
Abstract:

To achieve short focus of a high acceleration voltage by providing an objective lens control method for alleviating magnetic saturation in a device in which two or more objective lenses are combined and mounted.

There is provided a charged particle beam device which includes: charged particle beam acceleration means accelerating a charged particle beam emitted from a charged particle source; convergence means converging the charged particle beam accelerated by the charged particle beam acceleration means; scanning means two-dimensionally scanning a sample with the charged particle beam accelerated by the convergence means; and an objective lens converging the charged particle beam scanned by the scanning means on the sample. The objective lens is composed of a plurality of magnetic poles and a plurality of coils. A power supply independently applying a current to the plurality of coils is provided to simultaneously apply a current to the plurality of coils.


Inventors:
KAMIYA TOMOSATO
AGEMURA TOSHIHIDE
Application Number:
JP2012182832A
Publication Date:
March 06, 2014
Filing Date:
August 22, 2012
Export Citation:
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Assignee:
HITACHI HIGH TECH CORP
International Classes:
H01J37/141; H01J37/28
Attorney, Agent or Firm:
Manabu Inoue
Yuji Toda
Shigemi Iwasaki