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Patent Searching and Data


Title:
CMOS PLA CIRCUIT WITH FAULT DIAGNOSTIC FUNCTION
Document Type and Number:
Japanese Patent JPH01286519
Kind Code:
A
Abstract:

PURPOSE: To make the fault diagnosis of each part of the circuit efficient by inputting a constant check series independently of a logic function to each signal input line and a product term line control line of an AND matrix circuit and observing a parity signal outputted from a parity generating circuit.

CONSTITUTION: A regular check series independent of a logic function is given to signal lines 5, 27, 28 of a diagnostic input control circuit 22 and each product term line control line 25b of a diagnostic input product term line control circuit 25. In this case, number of sum term lines 24 giving a parity signal of a prescribed level from a parity generating circuit 26 of an OR matrix circuit 2 is subjected to parity check. Thus, a fault occurred in an AND matrix circuit 1 and the OR matrix circuit 2 is diagnosed efficiently by a simple circuit.


Inventors:
OTA NORIKAZU
HARADA YOSHIHISA
Application Number:
JP11543088A
Publication Date:
November 17, 1989
Filing Date:
May 12, 1988
Export Citation:
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Assignee:
TOYOTA CENTRAL RES & DEV
International Classes:
G01R31/3185; G06F11/22; H03K19/177; G01R31/28; (IPC1-7): G01R31/28; G06F11/22; H03K19/177