CONTROL FUNCTION INSPECTION DEVICE

Japanese Patent JP3389302

B2

PURPOSE: To simplify the inspection function of the control function inspection device which inspects an inspected device having a control function controlled with reference data, etc., stored in a ROM and to secure the control function of the inspected device after the inspection is completed.
CONSTITUTION: The inspected device performs a control processing on the basis of a processing procedure stored in a processing memory 13A and the data on a reference value, etc., stored in data memory 13B. The inspecting device inspects the control function of the inspected device on the basis of data on a processing procedure, a reference value, etc., stored in a processing memory 23. The data memory 13B is composed of an EEPROM and the storing function of the EEPROM is inspected at the final inspection stage of the inspection processing. Further, the storage contents such as normal reference data stored in the processing memory 23 of the inspection device are stored in the EEPROM after the final inspection stage ends. Even if the EEPROM is broken halfway in the inspection stage, that can securely be detected by the inspection in the final stage, so the storing function can be secured. The normal reference data, etc., are stored after the final inspection ends, so the control function based upon the reference data, etc., can be secured.

Hideyuki Katayanagi

JP29387093A

March 24, 2003

November 01, 1993

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Sanyo Electric Co., Ltd.

G05B23/02; (IPC1-7): G05B23/02

JP4171429A
JP467052A
JP5143384A
JP6280737A

Teruo Akimoto

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