Title:
CONTROL METHOD OF SAMPLE PREPARATION DEVICE, CONTROL DEVICE OF SAMPLE PREPARATION DEVICE, SAMPLE PREPARATION SYSTEM AND SAMPLE PREPARATION METHOD
Document Type and Number:
Japanese Patent JP2023011024
Kind Code:
A
Abstract:
To efficiently perform preparation of a measurement sample on the basis of density information of particles included in a specimen and a particle detection reagent, and accurately analyze measurement target particles in the specimen.SOLUTION: A sample preparation device 1 comprises: a measurement unit 2 which measures a specimen including particles acquired from a specimen container 10 to detect the measurement target particles in the specimen; a sample preparation unit 3 which can adjust the density of the measurement target particles in the specimen acquired from the specimen container 10 and prepares a measurement sample by mixing the specimen with multiple types of particle detection reagents including a particle label material; and a control unit 4 which generates density information of the measurement target particles in the specimen in the specimen container 10 on the basis of the measurement data of the measurement unit 2 and controls the sample preparation unit 3 so as to adjust the density of the measurement target particles in the specimen acquired from the specimen container 10 in accordance with the generated density information and the type of the multiple types of particle detection reagents used in preparation of the measurement sample.SELECTED DRAWING: Figure 1
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Inventors:
Takaaki Nagai
Oguni Shinichiro
Tomoyuki Tsuji
Oguni Shinichiro
Tomoyuki Tsuji
Application Number:
JP2022188730A
Publication Date:
January 20, 2023
Filing Date:
November 25, 2022
Export Citation:
Assignee:
Sysmex Corporation
International Classes:
G01N33/53; G01N15/14; G01N33/543
Attorney, Agent or Firm:
Saegusa International Patent Office