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Title:
DEFECT CORRECTION DEVICE, DEFECT CORRECTION METHOD, AND IMAGING DEVICE
Document Type and Number:
Japanese Patent JP2013098920
Kind Code:
A
Abstract:

To provide a defect correction device, a defect correction method, and an imaging device with which defect correction is performed on two images composing a 3D image without impairing a stereoscopic effect.

A defect correction device detects each defective pixel in a first image, detects each defective pixel in a second image, detects a defective area composed of the defective pixel detected in the first image, detects a defective area composed of the defective pixel detected in the second image, sets a range, in which defect correction is to be performed in the first image, based on the defective pixel detected in the first image and the detected defective area, sets a range, in which defect correction is to be performed in the second image, based on the defective pixel detected in the second image and the detected defective area, performs defect correction processing on the first image, based on the set correction range, and performs defect correction processing on the second image, based on the set correction range.


Inventors:
KITAGAWA TAKASHI
Application Number:
JP2011242517A
Publication Date:
May 20, 2013
Filing Date:
November 04, 2011
Export Citation:
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Assignee:
SONY CORP
International Classes:
H04N5/367; G06T19/20; H04N5/225; H04N5/232
Attorney, Agent or Firm:
Masatomo Sugiura
Takuma Sugiura