Title:
DEFECT DETECTION METHOD FOR THERMISTOR ELEMENT
Document Type and Number:
Japanese Patent JP2016039376
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a defect detection method for a thermistor element capable of efficiently detecting an internal defect within a thermistor.SOLUTION: The defect detection method includes the steps of: measuring a frequency response property of impedance; creating a Cole-Cole plot with a real number component R as a transverse axis and an imaginary number component X as a vertical axis; defining the real number component R in a low frequency lower limit of a curve obtained in the plot as Rmax and calculating a semicircle of a virtual circle of which the center is (Rmax/2, 0) and which is approximate to the curve; calculating a degree of distortion of the curve obtained in the plot from the semicircle as a distortion rate; setting a minimum distortion rate under the presence of the internal defect as a reference value on the basis of correlation data between the distortion rate that is calculated by measuring a plurality of elements beforehand and the presence/absence of the internal defect in an element assembly; and determining the presence of the internal defect in the element assembly in the case where the calculated distortion rate is greater than the reference value.SELECTED DRAWING: Figure 1
Inventors:
FUJIWARA KAZUTAKA
NAGATOMO KENSHO
INUI SHINICHIRO
NAGATOMO KENSHO
INUI SHINICHIRO
Application Number:
JP2015156259A
Publication Date:
March 22, 2016
Filing Date:
August 06, 2015
Export Citation:
Assignee:
MITSUBISHI MATERIALS CORP
International Classes:
H01C7/04; H01C7/02
Domestic Patent References:
| JPH07294568A | 1995-11-10 | |||
| JPH0613165A | 1994-01-21 | |||
| JPS61262650A | 1986-11-20 | |||
| JPH01253205A | 1989-10-09 | |||
| JPH02275601A | 1990-11-09 | |||
| JPH01270202A | 1989-10-27 |
Attorney, Agent or Firm:
Hideyuki Sugiura