Title:
DEFECT INSPECTION DEVICE
Document Type and Number:
Japanese Patent JP2017156343
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide a defect inspection device that can highly accurately grasp and detect not only the number of defects but also a shape of the defect with respect to fine defects such as fuzz and the like on a sheet surface during conveyance to solve the problem in which conventional defect inspection device and defect inspection method inspecting the fine defect of the sheet can partially detect presence or absence of the defect, but cannot highly accurately detect a shape of the defect or dimensions of the defect affecting post-processing of the sheet.SOLUTION: A defect inspection device, which inspects a defect of a sheet 1 to be conveyed in contact with a rotor 2, comprises imaging means 4 that has a light reception surface 11 at a location opposing a conveyance direction 8 of the sheet around a center point P of a surface to be formed in contact of the sheet with the rotor. An angle formed with a surface to be formed by the center point P and a rotary shaft O of the rotor and the light reception surface is within 10 degrees.SELECTED DRAWING: Figure 2
Inventors:
KOBAYASHI HIROSHI
IRIE SATOSHI
SUGIYAMA HAYATE
IRIE SATOSHI
SUGIYAMA HAYATE
Application Number:
JP2017019614A
Publication Date:
September 07, 2017
Filing Date:
February 06, 2017
Export Citation:
Assignee:
TORAY INDUSTRIES
International Classes:
G01N21/898; D06H3/08
Domestic Patent References:
| JPH0933449A | 1997-02-07 |
Foreign References:
| US20040184639A1 | 2004-09-23 | |||
| US20040008870A1 | 2004-01-15 | |||
| US6344872B1 | 2002-02-05 | |||
| CN105277560A | 2016-01-27 |