Title:
DEVICE AND METHOD FOR INSPECTING EDDY CURRENT
Document Type and Number:
Japanese Patent JPH11352109
Kind Code:
A
Abstract:
To provide an eddy current inspection device which has a simple structure and can eliminate an error in magnetic field measurement caused by temperature drift in a detection part.
A heater 32 is turned on beforehand to raise the temperature of a probe holder 3, and is set so as to keep the temperature, for example, at 50°C. After the temperature of the probe holder 3 becomes constant, a current is supplied to a probe detection part 2 and a steel pipe T is carried to start the measurement of a decarbonized layer. The magnetic field measurement error of the probe detection part 2 can be eliminated, as the temperature drift in the probe detection part 2 is not generated.
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Inventors:
YANO MASAYA
FUKUDA TOSHIBUMI
MINAMIDE TADAHIRO
FUKUDA TOSHIBUMI
MINAMIDE TADAHIRO
Application Number:
JP15944698A
Publication Date:
December 24, 1999
Filing Date:
June 08, 1998
Export Citation:
Assignee:
SUMITOMO METAL IND
NIPPON FUERUSUTAA KK
NIPPON FUERUSUTAA KK
International Classes:
G01N27/90; (IPC1-7): G01N27/90
Attorney, Agent or Firm:
Tono Kono