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Patent Searching and Data


Title:
GUIDE DEVICE
Document Type and Number:
Japanese Patent JPH11352110
Kind Code:
A
Abstract:

To improve measurement accuracy of a test device, which does not contact a material when it is gently guided.

This guide device can be used as an inlet or outlet nozzle in a test device to carry out a nondestructive material test by eddy current, and is especially used for linearly guiding an extended object such as a wire. The guide device is built in a guide sleeve and has a brush which is formed so as to function as a damping device 35 to damp the vibration of the passing object. Thereby a wire guided by the guide device so as to protect its surface receives little or no vibration in the crossing direction when it enters the vicinity of a test probe, so that the disturbance can be reduced to increase the accuracy of measurement.


Inventors:
HAEBERLEIN PETER
Application Number:
JP13029199A
Publication Date:
December 24, 1999
Filing Date:
May 11, 1999
Export Citation:
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Assignee:
FOERSTER INST DR FRIEDRICH
International Classes:
B65H57/12; G01N27/90; (IPC1-7): G01N27/90
Attorney, Agent or Firm:
Toru Tanabe